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SDC-580轮播大图1.png
SDC-580轮播大图1.png

SDC-580Fully automatic wafer contact angle measuring instrument

Product comparison

Product Features

  • Unique design of the sample stage, specially designed for wafers;
  • Can meet 6-12 inch wafer samples for testing;
  • Matrix multi-point test, accurate and convenient test;
  • Measure 50 points at one time, display the data directly in the original image and save it;
  • Product description
  • Specification parameters
  • Hardware options
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